Article ID | Journal | Published Year | Pages | File Type |
---|---|---|---|---|
9567506 | Applied Surface Science | 2005 | 5 Pages |
Abstract
We have analyzed the height dependence of the Si and Sn atoms on the 1/6 monolayer (ML) Sn/Si(1 1 1)-(â3 Ã â3)R30° surface, also known as Sn/Si(1 1 1) mosaic phase, by means of non-contact atomic force microscopy (NC-AFM) technique. By preparing samples in which the Sn/Si(1 1 1) mosaic phase and the Si(1 1 1)-(7 Ã 7) surfaces coexist, and taking account of the proportion of bright and dim contrast atoms when comparing NC-AFM images of both surfaces, we have been able to discriminate between the two atom species forming the mosaic phase. Additionally, we have found a pronounced variation of the height of the Si adatoms with the number of first neighboring Sn adatoms in the Sn/Si(1 1 1) mosaic phase.
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Physical Sciences and Engineering
Chemistry
Physical and Theoretical Chemistry
Authors
Y. Sugimoto, M. Abe, K. Yoshimoto, O. Custance, I. Yi, S. Morita,