Article ID Journal Published Year Pages File Type
9567525 Applied Surface Science 2005 4 Pages PDF
Abstract
We discussed a new design of a Wien filter energy analyzer for an energy-filtered X-ray photoemission electron microscopy system. We have demonstrated that the second-order aberration and the third-order aperture aberration can be corrected by the multipole Wien filter by adjusting multipole components of electric and magnetic fields up to octupole components. The three-dimensional charge simulation method indicated that 12 electrodes and magnetic poles can effectively reproduce these ideal electric and magnetic fields.
Related Topics
Physical Sciences and Engineering Chemistry Physical and Theoretical Chemistry
Authors
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