| Article ID | Journal | Published Year | Pages | File Type | 
|---|---|---|---|---|
| 9567525 | Applied Surface Science | 2005 | 4 Pages | 
Abstract
												We discussed a new design of a Wien filter energy analyzer for an energy-filtered X-ray photoemission electron microscopy system. We have demonstrated that the second-order aberration and the third-order aperture aberration can be corrected by the multipole Wien filter by adjusting multipole components of electric and magnetic fields up to octupole components. The three-dimensional charge simulation method indicated that 12 electrodes and magnetic poles can effectively reproduce these ideal electric and magnetic fields.
											Related Topics
												
													Physical Sciences and Engineering
													Chemistry
													Physical and Theoretical Chemistry
												
											Authors
												H. Niimi, M. Kato, T. Tsutsumi, T. Kawasaki, H. Matsudaira, S. Suzuki, W.-J. Chun, Y. Kitajima, M. Kudo, K. Asakura, 
											