Microstructure evolution of electroless Ni-B film during its depositing process

An electroless Ni-B film was deposited in natural state of the plating bath. The structure and composition distribution in depth of the film were explored by X-ray diffraction (XRD) and Auger electron spectroscopy (AES) after the deposition. It was found that the film experienced morphologic transformations during the deposition. The morphology of the film varied in-step with its structure and was presumably relevant with the changes of depositing rate. The mechanism that leads to the morphologic transformations has been discussed.