Article ID | Journal | Published Year | Pages | File Type |
---|---|---|---|---|
9572123 | Applied Surface Science | 2005 | 7 Pages |
Abstract
Organic monolayers on hydrogen-terminated silicon surfaces were prepared under extremely mild conditions using visible light and analyzed by a variety of surface-sensitive techniques: (angle-resolved) X-ray photoelectron spectroscopy (ARXPS), scanning tunneling microscopy (STM), high-resolution electron energy loss spectroscopy (HREELS), and attenuated total reflection infrared spectroscopy (ATR-IR). Detailed XPS and STM analysis of non-functionalized monolayers displays detailed mechanistic and structural information. Additionally, we present the first attachment of a disaccharide to the silicon surface, and a characterization thereof by ATR-IR and HREELS.
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Authors
Louis C.P.M. de Smet, Aliaksei V. Pukin, Qiao-Yu Sun, Brian J. Eves, Gregory P. Lopinski, Gerben M. Visser, Han Zuilhof, Ernst J.R. Sudhölter,