Article ID | Journal | Published Year | Pages | File Type |
---|---|---|---|---|
9572162 | Applied Surface Science | 2005 | 5 Pages |
Abstract
We present a study of the electronic properties of the interface between the well-established molecular organic semiconductor copper phthalocyanine (CuPc) and the fullerite C60 using photoelectron spectroscopy and the Kelvin-probe (KP) method. Upon deposition of CuPc on C60, we found interfacial shifts of the vacuum level indicating the formation of a dipole layer, while band bending is found to be negligible. The interface dipole of 0.5Â eV measured with KP is close to the difference between the work functions of bulk CuPc and C60. No evidence for a chemical interaction at the interface is concluded from the absence of additional features in the core-level spectra at the earliest stages of deposition. The energy-level alignment diagram at the CuPc/C60 interface is derived.
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Physical Sciences and Engineering
Chemistry
Physical and Theoretical Chemistry
Authors
O.V. Molodtsova, T. Schwieger, M. Knupfer,