| Article ID | Journal | Published Year | Pages | File Type |
|---|---|---|---|---|
| 9572195 | Applied Surface Science | 2005 | 6 Pages |
Abstract
Based on these observations layer models for quantification of ARXPS measurements by means of model calculations were derived, so it was possible to obtain information on the in-depth element distribution in a non-destructive manner. For comparison to the ARXPS investigations analyses of the inelastic background of the Ta4d peak are shown and discussed.
Related Topics
Physical Sciences and Engineering
Chemistry
Physical and Theoretical Chemistry
Authors
M. Zier, S. Oswald, R. Reiche, K. Wetzig,