| Article ID | Journal | Published Year | Pages | File Type |
|---|---|---|---|---|
| 9572204 | Applied Surface Science | 2005 | 5 Pages |
Abstract
All samples were investigated with secondary ion mass spectrometry (SIMS), showing a diffusion of carbon into the molybdenum layer. Measuring MCs+ secondary ions, both matrix elements and trace elements were detectable sufficiently.
Related Topics
Physical Sciences and Engineering
Chemistry
Physical and Theoretical Chemistry
Authors
K.E. Mayerhofer, C. Schrank, C. Eisenmenger-Sittner, H. Hutter,