| Article ID | Journal | Published Year | Pages | File Type |
|---|---|---|---|---|
| 9572486 | Applied Surface Science | 2005 | 5 Pages |
Abstract
On the other hand, PEEM images and the Si L2,3 fluorescence spectra for specimens of Zr(film)/4H-SiC(0 0 0 1)Si face contact system annealed at 650-1100 °C have indicated that interfaces of specimens are stable up to 1100 °C without any reaction.
Related Topics
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Physical and Theoretical Chemistry
Authors
M. Hirai, C. Kamezawa, S. Azatyan, Z. An, T. Shinagawa, T. Fujisawa, M. Kusaka, M. Iwami,