| Article ID | Journal | Published Year | Pages | File Type |
|---|---|---|---|---|
| 9577197 | Chemical Physics Letters | 2005 | 4 Pages |
Abstract
X-ray reflectivity is used to study the interfacial structure of liquid squalane on SiO2/Si(1Â 0Â 0) substrates. The data show that there are density oscillations ('layers') near the interface, with the squalane molecular long axes parallel to the substrate. The results are compared to those from molecular dynamics simulations and recent force measurements.
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Physical and Theoretical Chemistry
Authors
Haiding Mo, Guennadi Evmenenko, Pulak Dutta,