Article ID | Journal | Published Year | Pages | File Type |
---|---|---|---|---|
9577579 | Chemical Physics Letters | 2005 | 5 Pages |
Abstract
Ionic fragmentation caused by Si:1s photoionization of 1-trifluorosilyl-2-trimethylsilylethane [F3SiCH2CH2Si(CH3)3] vapor was studied by the energy-selected photoelectron photoion coincidence method and monochromatized synchrotron radiation. In the 1s photoionization at the Si atom bonded to three F atoms, H+ exceeded the other ions in the peak height, and production of SiF3+ ion seemed to be reduced. On the other hand, the 1s photoionization at the other Si atom bonded to three CH3 groups enhanced production of H+ ion with high kinetic energy. These results suggest that Si:1s photoionization causes site-specific fragmentation.
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Authors
S. Nagaoka, Y. Tamenori, M. Hino, T. Kakiuchi, J. Ohshita, K. Okada, T. Ibuki, I.H. Suzuki,