Article ID | Journal | Published Year | Pages | File Type |
---|---|---|---|---|
9577924 | Chemical Physics Letters | 2005 | 5 Pages |
Abstract
A quantitative method for the structural determination by electron diffraction of nanotubes of elliptical cross-section is developed as a general case while the cylindrical nanotubes are treated as a special class. We found that the chiral indices of a carbon nanotube can always be measured from the electron diffraction pattern regardless if the nanotube is circular or elliptical. An experimental electron diffraction pattern from a partly-deformed carbon nanotube is also analyzed. Assisted with numerical simulations, it is determined that the observed carbon nanotube has chiral indices (15,7) with 8° tilt relative to the horizontal plane and eccentricity of 0.553.
Related Topics
Physical Sciences and Engineering
Chemistry
Physical and Theoretical Chemistry
Authors
Zejian Liu, Lu-Chang Qin,