Article ID | Journal | Published Year | Pages | File Type |
---|---|---|---|---|
9585170 | Journal of Electron Spectroscopy and Related Phenomena | 2005 | 9 Pages |
Abstract
The electronic structure of C60/SiOx/Si(1 0 0) interface was studied by photoemission (valence-bands, C 1s, and Si 2p core levels) and near-edge X-ray absorption fine structure (C 1s threshold) spectroscopies. It was concluded that the SiOx/Si surface is non-reactive with respect to the interaction with C60. The exposure of the C60/SiOx/Si system under non-monochromatic synchrotron radiation causes modification of the electronic structure of this system. It is explained by polymerization of the C60 molecules and arising a strong ionic-like interaction of the polymerized C60 with the SiOx surface. Annealing of this system up to temperatures of 550-625 °C leads to complete desorption of the C60 molecules from the non-irradiated sample areas while the modified by radiation fullerenes remain attached to the substrate.
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Physical Sciences and Engineering
Chemistry
Physical and Theoretical Chemistry
Authors
A.M. Shikin, S.I. Fedoseenko, I.M. Aliev, V.K. Adamchuk, S. Danzenbächer, S.L. Molodtsov,