Article ID | Journal | Published Year | Pages | File Type |
---|---|---|---|---|
9585220 | Journal of Electron Spectroscopy and Related Phenomena | 2005 | 13 Pages |
Abstract
Advantages and shortcomings of REELM are outlined against the diagnostic value of parallel results obtained by scanning Auger microscopy (SAM) techniques. Although comparatively poor focussing powers preclude the attainment of high spatial resolution, and spectral interference problems may hinder the chemical characterization of multi-phase materials, REELM features unique capabilities. Among others, these include a chemical contrast that is much superior to that of SAM, the possibility of characterizing the coverage distribution of adlayer surface species, as well as of investigating the microchemistry of insulators' surfaces. The first application of REELM in the analysis of archaeological materials is presented.
Related Topics
Physical Sciences and Engineering
Chemistry
Physical and Theoretical Chemistry
Authors
E. Paparazzo,