| Article ID | Journal | Published Year | Pages | File Type |
|---|---|---|---|---|
| 9585222 | Journal of Electron Spectroscopy and Related Phenomena | 2005 | 9 Pages |
Abstract
X-ray photoelectron spectroscopy has, in recent years advanced, to the point where spectra may be acquired from areas as small as 10 μm. XPS images may be acquired with a spatial resolution of around 3 μm. The key instrumental developments which have led to these advances are reviewed together with examples of images and applications.
Keywords
Related Topics
Physical Sciences and Engineering
Chemistry
Physical and Theoretical Chemistry
Authors
Christopher J. Blomfield,