| Article ID | Journal | Published Year | Pages | File Type |
|---|---|---|---|---|
| 9585449 | Journal of Electron Spectroscopy and Related Phenomena | 2005 | 25 Pages |
Abstract
This review presents the recent developments published in the literature about the use of Auger electron spectroscopy (AES) and X-ray photoelectron spectroscopy (XPS) at high energy or spatial resolution. The past and present improvements due to technology (analysers, excitation source), and to mathematical procedures are described and discussed. New trends in the application of AES and XPS are related.
Related Topics
Physical Sciences and Engineering
Chemistry
Physical and Theoretical Chemistry
Authors
François Reniers, Craig Tewell,