Article ID | Journal | Published Year | Pages | File Type |
---|---|---|---|---|
9594475 | Surface Science | 2005 | 8 Pages |
Abstract
The growth of 2-40Â ML Cu on Ag(1Â 1Â 1) is investigated using scanning tunnelling microscopy (STM). The surface morphology of this bimetallic system appears to be dominated by Ag segregation. At large Cu coverages, a very moderate annealing favours the segregation process and the formation of characteristic pits penetrating through the Cu film. The segregation effect is evidenced by the (9Â ÃÂ 9) superstructure reported for one Ag monolayer deposited onto Cu(1Â 1Â 1). Some holes that penetrate well into the Ag substrate are interpreted as efficient diffusion paths for Ag atoms segregating towards the surface.
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Authors
C. Maurel, M. Abel, M. Koudia, F. Bocquet, L. Porte,