| Article ID | Journal | Published Year | Pages | File Type |
|---|---|---|---|---|
| 9594527 | Surface Science | 2005 | 10 Pages |
Abstract
Films were studied by AFM and showed distinct crystallographic grains (sized â¼50Â nm) after annealing. The lattice constant of thin films was lower than for the bulk target material, but was not correlated with annealing temperature.
Keywords
Related Topics
Physical Sciences and Engineering
Chemistry
Physical and Theoretical Chemistry
Authors
R. Schmidt, A. Basu, A.W. Brinkman, T.P.A. Hase, Z. Klusek, S. Pierzgalski, P.K. Datta,