Article ID | Journal | Published Year | Pages | File Type |
---|---|---|---|---|
9594732 | Surface Science | 2005 | 8 Pages |
Abstract
We present a study focussed at the atomic level characterization of the Fe/MgO(0Â 0Â 1) interface by means of X-ray photoelectron spectroscopy, X-ray photoelectron diffraction and X-ray absorption spectroscopy. The data show a good crystalline quality of the Fe films grown on MgO(0Â 0Â 1) at room temperature. The films have a bcc structure with the Fe(0Â 0Â 1)//MgO(0Â 0Â 1) and Fe[1Â 1Â 0]//MgO[1Â 0Â 0] orientation. The Fe growth in the 1-10Â ML thickness range proceeds by the formation of islands covering a fraction of the MgO surface. The oxidation of Fe and the consequent reduction of MgO can be excluded, thus proving that the interface is locally abrupt, with a very weak interaction between the two sides. The interface is stable with temperature up to 670Â K.
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Physical Sciences and Engineering
Chemistry
Physical and Theoretical Chemistry
Authors
P. Luches, S. Benedetti, M. Liberati, F. Boscherini, I.I. Pronin, S. Valeri,