| Article ID | Journal | Published Year | Pages | File Type |
|---|---|---|---|---|
| 9595144 | Surface Science | 2005 | 8 Pages |
Abstract
Spot profile analysis low energy electron diffraction (SPA-LEED) and low temperature scanning tunneling microscopy (LT-STM) measurements were performed on an ultra thin alumina film grown at 1000 K in an oxygen atmosphere on Ni3Al(1 1 1). By the aid of these two experimental techniques it has been shown that the alumina film exhibits a large superstructure with a lattice constant of 4.16 nm. The unit cell of this superstructure has a commensurate (â67 Ã â67)R47.784° relation to the Ni3Al(1 1 1) substrate lattice.
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Authors
S. Degen, A. Krupski, M. Kralj, A. Langner, C. Becker, M. Sokolowski, K. Wandelt,