Article ID | Journal | Published Year | Pages | File Type |
---|---|---|---|---|
9599201 | Journal of Quantitative Spectroscopy and Radiative Transfer | 2005 | 9 Pages |
Abstract
Measurements have been made to determine the mass attenuation coefficients of undoped n-type InSe, and Gd, Ho, Er doped n-InSe single crystals using a Si(Li) detector in the energy region 15.746-40.930keV X-ray energies with energy dispersive X-ray fluorescence systems. InSe, InSe:Gd, InSe:Ho and InSe:Er single crystals were grown by using the stockbarger method. The measured values are graphically compared with the theoretical ones obtained using WinXcom.
Related Topics
Physical Sciences and Engineering
Chemistry
Spectroscopy
Authors
Orhan Ä°çelli, Salih Erzeneoǧlu, Bekir Gürbulak,