| Article ID | Journal | Published Year | Pages | File Type | 
|---|---|---|---|---|
| 9599201 | Journal of Quantitative Spectroscopy and Radiative Transfer | 2005 | 9 Pages | 
Abstract
												Measurements have been made to determine the mass attenuation coefficients of undoped n-type InSe, and Gd, Ho, Er doped n-InSe single crystals using a Si(Li) detector in the energy region 15.746-40.930keV X-ray energies with energy dispersive X-ray fluorescence systems. InSe, InSe:Gd, InSe:Ho and InSe:Er single crystals were grown by using the stockbarger method. The measured values are graphically compared with the theoretical ones obtained using WinXcom.
											Related Topics
												
													Physical Sciences and Engineering
													Chemistry
													Spectroscopy
												
											Authors
												Orhan İçelli, Salih Erzeneoǧlu, Bekir Gürbulak, 
											