Article ID | Journal | Published Year | Pages | File Type |
---|---|---|---|---|
9618703 | Solar Energy Materials and Solar Cells | 2005 | 11 Pages |
Abstract
Light reflectance patterns in chemically textured (1Â 0Â 0)Si wafers exhibit 4-fold symmetry with intensity maxima at well-defined off centre angular positions. The relation between the light pattern and the geometrical features of the texture is discussed. A method that relates the reflected intensities with the texture degree is developed and tested.
Related Topics
Physical Sciences and Engineering
Chemical Engineering
Catalysis
Authors
E. Forniés, C. Zaldo, J.M. Albella,