Article ID Journal Published Year Pages File Type
9638204 Fusion Engineering and Design 2005 6 Pages PDF
Abstract
This paper deals with the electro magnetic interferences (EMI) induced on diagnostics and control circuits of fusion experiments, due to fast common mode voltages (Vcm) transients. The Vcm can excite the circulation of noise currents through parasitic capacitances, which couple different parts of the circuit designed to be isolated one to another. Equivalent electric circuits of the phenomena observed in RFX have been derived, which explain the induced noises and have been utilized to identify suitable correction measures; the paper describes these analyses and the experience gained in coping with the reduction of these types of EMI interferences.
Related Topics
Physical Sciences and Engineering Energy Energy Engineering and Power Technology
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