| Article ID | Journal | Published Year | Pages | File Type |
|---|---|---|---|---|
| 9678348 | Colloids and Surfaces B: Biointerfaces | 2005 | 7 Pages |
Abstract
To obtain information on the micro- and nano-scale surface structure, tapping mode atomic force microscopy (AFM) imaging was employed to determine morphology and roughness information of dry spin-cast chitosan films.
Keywords
Related Topics
Physical Sciences and Engineering
Chemical Engineering
Colloid and Surface Chemistry
Authors
W.H. Nosal, D.W. Thompson, L. Yan, S. Sarkar, A. Subramanian, J.A. Woollam,