Article ID | Journal | Published Year | Pages | File Type |
---|---|---|---|---|
9699175 | Materials Science in Semiconductor Processing | 2005 | 5 Pages |
Abstract
A low-cost BiCMOS SiGe:C-HBT is accurately modeled using adaptive neuro-fuzzy inference system (ANFIS) for the first time. The Volterra kernel-based approach can be suitable for this new kind of modeling. The model has been trained and tested with different sets of input/output data. Accuracy of the model is checked for all the DC and S parameters in a wide range of bias and frequencies. On the validation of the ANFIS model, the average error is found to be less than 4%. Especially in high-current and high-frequency regions, the ANFIS model is proved to be excellent unlike most of the physics-based equivalent circuit models that fail to track the actual device behavior.
Related Topics
Physical Sciences and Engineering
Engineering
Electrical and Electronic Engineering
Authors
A. Chakravorty, R.F. Scholz, B. Senapati, D. Knoll, A. Fox, R. Garg, C.K. Maiti,