Article ID | Journal | Published Year | Pages | File Type |
---|---|---|---|---|
9709019 | Journal of Materials Processing Technology | 2005 | 6 Pages |
Abstract
Here we propose, also, a non-parametric method, based on the wavelet theory, for the estimation of the threshold level of a gray levels distribution, obtained from the intensity image matrix.
Related Topics
Physical Sciences and Engineering
Engineering
Industrial and Manufacturing Engineering
Authors
Vincenzo Niola, Gennaro Nasti, Giuseppe Quaremba,