Article ID | Journal | Published Year | Pages | File Type |
---|---|---|---|---|
9746683 | International Journal of Mass Spectrometry | 2005 | 5 Pages |
Abstract
The photoion yield curves for Dy@C82z+ (z = 1 and 2) from Dy@C82 are measured by using synchrotron radiation in the photon energy range from 24.5 to 39.5 eV. Correction has been made to compensate the effect of transient change of the density of Dy@C82 in the interaction region, with the help of the yield curve of C60z+ produced from C60 remaining as a trace impurity in the sample. The yield of Dy@C82+ exhibits a gradually descending curve with a flat region at 30-33 eV, similarly to the yield curve of C60+ from C60. The total photoabsorption cross section of Dy@C82 was evaluated to be (1.2 ± 0.4) Ã 10â20 m2 at the photon energy of 39.5 eV.
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Authors
Koichiro Mitsuke, Takanori Mori, Junkei Kou, Yusuke Haruyama, Yasuhiro Takabayashi, Yoshihiro Kubozono,