Article ID | Journal | Published Year | Pages | File Type |
---|---|---|---|---|
9761768 | Solid State Ionics | 2005 | 5 Pages |
Abstract
High oxide-ion conducting material δ-Bi2O3 was electrodeposited on stainless steel and polycrystalline Au substrates at low temperature. Both X-ray diffraction (XRD) measurements and transmission electron microscopy (TEM) images revealed nanocrystallites about 100 nm in size inside the electrodeposited δ-Bi2O3 thin films. High-resolution TEM images showed the existence of smaller nanocrystallites 10-20 nm in diameter. The long-term stability of the electrodeposited δ-Bi2O3 was checked by XRD measurements on 1-year-old samples. Its thermal stability was studied through a series of annealing at different temperatures. At an annealing temperature of 340 °C, the δ-Bi2O3fcc structure begins to change towards that of Sillenite (bcc).
Keywords
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Physical Sciences and Engineering
Chemistry
Electrochemistry
Authors
A. Helfen, S. Merkourakis, G. Wang, M.G. Walls, E. Roy, K. Yu-Zhang, Y. Leprince-Wang,