Article ID | Journal | Published Year | Pages | File Type |
---|---|---|---|---|
9774255 | Surface Science Reports | 2005 | 152 Pages |
Abstract
After the review of Cappella [B. Cappella, G. Dietler, Surf. Sci. Rep. 34 (1999) 1-104] 6 years of intense development have occurred. In 1999, the AFM was used only by experts to do force measurements. Now, force curves are used by many AFM researchers to characterize materials and single molecules. The technique and our understanding of surface forces has reached a new level of maturity. In this review we describe the technique of AFM force measurements. Important experimental issues such as the determination of the spring constant and of the tip radius are discussed. Current state of the art in analyzing force curves obtained under different conditions is presented. Possibilities, perspectives but also open questions and limitations are discussed.
Keywords
PEIAFMLPSSDSCMCCTABPTFEPDMSPAHDMAPVPSEDSDLVOPSSPAAPSDDGDGMGDGmonogalactosyldiacylglycerolPLAHSASAMPMCSTMPFMCSHSFADMTAOTFJCPSUPBAWLCSNOMDOPSDOPCPVDDOTAPDSPEDTABOTSDDAB1,2-Distearoyl-sn-glycero-3-phosphoethanolaminePDADMACUHVHOPGDODABOctadecyltrichlorosilaneTIRMPMAABis(2-ethylhexyl)sulfosuccinateTTABJKRDSCGPoly(sodium styrenesulfonate)PBMAPulsed force mode1,2-dioleoyl-sn-glycero-3-phospho-l-serineMEMS1,2-dioleoyl-sn-glycero-3-phosphocholineBSADNAPosition sensitive detectorhuman serum albuminbovine serum albuminEDTAEthylenediaminetetraacetic acidTemDynamical mechanical analysisSelf-assembled monolayerUltra-high vacuumSurface forces apparatusdodecyltrimethylammonium bromideDisodium cromoglycateMolecular dynamicsPhysical Vapor DepositionFreely jointed chainWormlike chainsodium dodecylsulfateMicro-electromechanical systemsX-ray photoelectron spectroscopyXPSLipopolysaccharidesSEMMelamine formaldehydeForce curvesscanning electron microscopeTransmission electron microscopeTotal internal reflection microscopyScanning tunneling microscopeScanning near-field optical microscopeAtomic Force Microscopepolyelectrolyte microcapsulesSurface forcesCalcium silicate hydratePoly(tetrafluoroethylene)poly(dimethylsiloxane)PMMApolyethylene glycolpolyethyleneiminepoly(acrylic acid)Polylactic acidPEGDOPEPEOHighly oriented pyrolytic graphite
Related Topics
Physical Sciences and Engineering
Chemistry
Physical and Theoretical Chemistry
Authors
Hans-Jürgen Butt, Brunero Cappella, Michael Kappl,