| Article ID | Journal | Published Year | Pages | File Type |
|---|---|---|---|---|
| 977641 | Physica A: Statistical Mechanics and its Applications | 2008 | 11 Pages |
Abstract
An extension of the R/SR/S method to estimate the Hurst exponent of high-dimensional fractals is proposed. The method’s performance was adequate when tested with synthetic surfaces having different preset Hurst exponent values and different array sizes. The two-dimensional R/SR/S analysis is used to analyze three images from nature and experimental data, revealing interesting scaling behavior with physical meaning.
Keywords
Related Topics
Physical Sciences and Engineering
Mathematics
Mathematical Physics
Authors
Jose Alvarez-Ramirez, Juan C. Echeverria, Eduardo Rodriguez,