| Article ID | Journal | Published Year | Pages | File Type |
|---|---|---|---|---|
| 978068 | Physica A: Statistical Mechanics and its Applications | 2007 | 8 Pages |
Abstract
This paper introduces a relative structural complexity measure for the characterization of disordered surfaces. Numerical solutions of 2d+1 KPZ equation and scanning force microscopy (SFM) patterns of porous silicon samples are analyzed using this methodology. The results and phenomenological interpretation indicate that the proposed measure is efficient for quantitatively characterize the structural complexity of disordered surfaces (and interfaces) observed and/or simulated in nano, micro and ordinary scales.
Keywords
Related Topics
Physical Sciences and Engineering
Mathematics
Mathematical Physics
Authors
R.R. Rosa, M.P.M.A. Baroni, G.T. Zaniboni, A. Ferreira da Silva, L.S. Roman, J. Pontes, M.J.A. Bolzan,