Article ID Journal Published Year Pages File Type
9782956 Materials Chemistry and Physics 2005 5 Pages PDF
Abstract
The manganese oxides and polyaniline composite thin film was chemically deposited on porous carbon electrode through oxidizing aniline thin film by a KMnO4 solution. The capacitance and stability of this composite film were investigated by cyclic voltammetry (CV). The redox properties of the MnO2-polyaniline (M-P) thin film exhibited ideal capacitive behavior in a 0.1 M Na2SO4 solution. The capacitance of M-P film materials can reach 500 F g−1 and maintains about 60% of the initial capacitance after 5000 cycles. The structure and surface morphology of M-P film were examined in terms of the X-ray diffraction patterns (XRD) and scanning electron microscopic (SEM) photographs. The composition of M-P film was also studied by X-ray photoelectrons (XPS).
Related Topics
Physical Sciences and Engineering Materials Science Electronic, Optical and Magnetic Materials
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