| Article ID | Journal | Published Year | Pages | File Type |
|---|---|---|---|---|
| 9783915 | Materials Science and Engineering: B | 2005 | 4 Pages |
Abstract
The agreement between results obtained by spectroscopic ellipsometry (SE) and other optical techniques has been found.
Related Topics
Physical Sciences and Engineering
Materials Science
Electronic, Optical and Magnetic Materials
Authors
W. Rzodkiewicz, A. KudÅa, A. Misiuk, B. Surma, J. BÄ
k-Misiuk,