Article ID | Journal | Published Year | Pages | File Type |
---|---|---|---|---|
9783984 | Materials Science and Engineering: B | 2005 | 5 Pages |
Abstract
We report on optoelectronic properties of devices based on Si/Si1âxGex systems. To limit the inherent problems of the type II character and the indirect nature of the bandgap, we propose Si/Si1âxGex strained QWs embedded in relaxed Si1âyGey barriers. The conduction and the valence band present a W-, Usami- or M-like potential profile with a quasi-type I heterostructures. Based on Schrödinger equation, a theoretical analysis is made to calculate electric field dependent interband transitions in the three above-mentioned structures. The thickness and compositions (x > y) of these heterostructures are computed in order to get: (i) the optimum quantum confinement of electrons and heavy-holes levels; (ii) the optimum out of plane oscillator strength and wave functions overlap; (iii) to satisfy a fundamental emission at a key 1.55 μm wavelength below the absorption gap of the three designed structures. The effect of the applied electric field on quantum levels and oscillator strength is discussed.
Related Topics
Physical Sciences and Engineering
Materials Science
Electronic, Optical and Magnetic Materials
Authors
N. Sfina, J.-L. Lazzari, M. Said,