Article ID | Journal | Published Year | Pages | File Type |
---|---|---|---|---|
9784020 | Materials Science and Engineering: B | 2005 | 4 Pages |
Abstract
FePt (50 nm) and [FePt (x nm)/ZrO2 (0.5, 1, 2, 3 nm)]10 (x = 2, 5 nm) films were prepared by RF magnetron sputtering technique, then were annealed at 550 °C for 30 min. This work investigates the effect of ZrO2 layer thickness on structures and magnetic properties of FePt/ZrO2 multilayers. The X-ray diffraction results show that superlattice (0 0 1) peaks can be found in FePt (50 nm) and [FePt (5 nm)/ZrO2 (0.5, 1, 2, 3 nm)]10 films. Compared with single layer FePt film, superlattice (0 0 1) peaks of FePt/ZrO2 multilayers are wider and weaker, which indicates that introducing ZrO2 is advantageous to hinder the growth of FePt grains. The coercivities, grain size and intergrain interactions of FePt/ZrO2 films are decreased when ZrO2 layer thickness is increased. And grain volume (Vgrain) is almost identical to activation volume (V*) for added-ZrO2 films. Thus, the FePt/ZrO2 films with the appropriate coercivities, the small size of grains, and the weak intergrain interactions are obtained.
Related Topics
Physical Sciences and Engineering
Materials Science
Electronic, Optical and Magnetic Materials
Authors
Xiao-Hong Xu, Xiao-Li Li, Hai-Shun Wu,