Article ID | Journal | Published Year | Pages | File Type |
---|---|---|---|---|
9785529 | Optics Communications | 2005 | 5 Pages |
Abstract
Optical waveguide propagation loss measurement method based on optical multiple reflections detection is presented in this paper. By using a precision reflectometer, uncertain influence on waveguide propagation loss measurement caused by fiber-waveguide coupling can be eliminated effectively and the waveguide net propagation loss can be measured accurately. To demonstrate this, the propagation loss of a Silicon-on-Insulator (SOI) rib waveguide fabricated by RIE is measured with the obtained value being 4.3Â dB/cm. This method provides a non-destructive means for evaluating waveguide propagation loss.
Keywords
Related Topics
Physical Sciences and Engineering
Materials Science
Electronic, Optical and Magnetic Materials
Authors
Shaowu Chen, Qingfeng Yan, Qingyang Xu, Zhongchao Fan, Jingwei Liu,