Article ID | Journal | Published Year | Pages | File Type |
---|---|---|---|---|
9785610 | Optics Communications | 2005 | 4 Pages |
Abstract
A structural transformation induced by optical impulse excitation of only a few mJ/cm2 fluence affecting the nanoscale surface melt layer of gallium at a ZnSe-gallium interface leads to a fast, substantial and fully reversible change in reflectivity of up to 50%. Recovery occurs within a few μs after excitation is withdrawn and less than 1 μs at temperatures more than 4 K below gallium's melting point.
Related Topics
Physical Sciences and Engineering
Materials Science
Electronic, Optical and Magnetic Materials
Authors
M. Woodford, K.F. MacDonald, G.C. Stevens, N.I. Zheludev,