| Article ID | Journal | Published Year | Pages | File Type |
|---|---|---|---|---|
| 9786134 | Optics Communications | 2005 | 10 Pages |
Abstract
Dynamic speckle has been used in some biologic and industrial applications for the characterization of transient processes. The time evolution of processes that show the dynamic speckle phenomenon are here characterized using wavelets based entropy and employed in order to make quantitative and qualitative measurements of the sample activity. Both the results obtained in experiments on drying of paint and activity images in seeds and bruised fruits are shown as examples.
Related Topics
Physical Sciences and Engineering
Materials Science
Electronic, Optical and Magnetic Materials
Authors
I. Passoni, A. Dai Pra, H. Rabal, M. Trivi, R. Arizaga,