Article ID | Journal | Published Year | Pages | File Type |
---|---|---|---|---|
9786226 | Optics Communications | 2005 | 9 Pages |
Abstract
Non-symmetric reflection in anisotropic thin films is considered to correct the phase term of Airy formula. To measure the anisotropic optical constants of thin films accurately, the sensitivity of attenuated total reflection curve is calculated and analyzed. The analysis develops two curve fitting procedures to determine the optical constants of an anisotropic thin film.
Related Topics
Physical Sciences and Engineering
Materials Science
Electronic, Optical and Magnetic Materials
Authors
Yi-Jun Jen, Cheng-Hung Hsieh, Tsai-Sheng Lo,