| Article ID | Journal | Published Year | Pages | File Type |
|---|---|---|---|---|
| 9795233 | Materials Characterization | 2005 | 5 Pages |
Abstract
Ti-Ni-Pd thin films were deposited by RF magnetron sputtering. Microstructure and phase transformation behaviors were studied by X-ray diffraction (XRD), by transmission electron microscopy and by differential scanning calorimeter (DSC). Also tensile tests and the internal friction characteristics were examined. Annealing at 750 °C followed by subsequent annealing at 450 °C resulted in relatively homogeneous microstructure and uniform martensite/austenite transformation. The results from DSC showed clearly the martensitic transformation upon heating and cooling, the transformation temperatures are 112 °C (M* peak) and 91 °C (M peak), respectively. The transformation characteristics are also found in strain-temperature curves and internal friction-temperature curves. The film had shape memory effect. The frequency had no effect on the modulus, but the internal friction decreased with increasing frequency.
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Physical Sciences and Engineering
Materials Science
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Authors
Congchun Zhang, Chunsheng Yang, Duifu Ding, Shiqiang Qian, Jiansheng Wu,