Article ID | Journal | Published Year | Pages | File Type |
---|---|---|---|---|
9801916 | Solid State Communications | 2005 | 4 Pages |
Abstract
Uniformly distributed ZnO nanorods with two different densities were demonstrated using the standard submicron semiconductor process. Plasma-enhanced chemical vapor deposition and UV-lithography were used to predefine growth sites and to grow ZnO nanorods at 600 °C. Integrated and local field emission (FE) experiments were also performed in the same substrate, and both involved the F-N vacuum tunneling mechanism. A medium density of high aspect ratio nanorods shows better FE performance due to the screening effect. The ability to control the growth-site demonstrated the possibility of the integration and the better field emission properties of nanodevices by ZnO on silicon substrate.
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Authors
C.C. Chang, C.S. Chang,