| Article ID | Journal | Published Year | Pages | File Type |
|---|---|---|---|---|
| 9801993 | Solid State Communications | 2005 | 7 Pages |
Abstract
We solve the two-band model for the transport across a junction between a semimetal and an excitonic insulator. We analyze the current in terms of two competing terms associated with neutral excitons and charged carriers, respectively. We find a high value for the interface resistance, extremely sensitive to the junction transparency. We explore favorable systems for experimental confirmation.
Keywords
Related Topics
Physical Sciences and Engineering
Materials Science
Materials Science (General)
Authors
Massimo Rontani, L.J. Sham,