Article ID | Journal | Published Year | Pages | File Type |
---|---|---|---|---|
9803215 | Journal of Alloys and Compounds | 2005 | 4 Pages |
Abstract
Surface phenomena which occur in the process of palladium hydride PdHx formation during H2 interaction “in situ” with thin palladium films were studied by means of two methods: (i) measurements of work function changes ÎΦ, and (ii) determination of topographical images using atomic force microscopy (AFM). A very strong decrease of the work function up to â¼ 2âV was registered in the course of the reaction at 78âK when thin Pd films deposited on Pyrex glass were applied. However a small ÎΦ was noticed when using Pd films deposited on glass precovered with a thick platinum film. AFM topography exhibited a net of distinct protrusions in the first case, but the topography was almost unchanged in the second. We suggest that the above unusually high decrease of the work function in the process of PdHx formation within a Pd/glass system is caused by the change of thin Pd film topography, and not by very strong polarization of hydrogen adspecies on PdHx surface.
Related Topics
Physical Sciences and Engineering
Materials Science
Metals and Alloys
Authors
R. DuÅ, R. Nowakowski, E. Nowicka,