| Article ID | Journal | Published Year | Pages | File Type |
|---|---|---|---|---|
| 9803400 | Journal of Alloys and Compounds | 2005 | 4 Pages |
Abstract
We have studied thin Fe films by soft X-ray absorption spectroscopy to determine the total electron yield (TEY) sampling depth (λe) at the Fe L2,3 edge. For this, we have recorded high-resolution X-ray absorption spectra in TEY resolving the near edge X-ray absorption fine structure (NEXAFS). Our analysis yields a value of λe = 21 ± 2 Ã
for the TEY sampling depth.
Related Topics
Physical Sciences and Engineering
Materials Science
Metals and Alloys
Authors
Y. Ufuktepe, G. Akgül, J. Lüning,