Article ID | Journal | Published Year | Pages | File Type |
---|---|---|---|---|
9808737 | Materials Letters | 2005 | 6 Pages |
Abstract
The effect of the sample thickness d on the residual voltage ratio Kr indicates the existence of the dimensional effect in the commercial ZnO varistors. The empirical relations derived are based on experimental findings for Kr and breakdown electric field strength E1 mA cmâ2 and the microstructural parameter average grain size μ. It is observed that Kr decreases with increasing E1 mA cmâ2, while it increases with increasing μ. An integrated hybrid parameter Ï2μ, obtained as the product of average grain size μ and grain size variance Ï2, is found to be a representative relation between electrical properties and microstructure of the ZnO varistors. A microstructural model is used for computer simulation that also verified the dimensional effect in these varistors. The simulated results are consistent with the experimental results.
Keywords
Related Topics
Physical Sciences and Engineering
Materials Science
Nanotechnology
Authors
Shengtao Li, Feng Xie, Fuyi Liu, Jianying Li, Mohammad A. Alim,