Article ID | Journal | Published Year | Pages | File Type |
---|---|---|---|---|
9809968 | Surface and Coatings Technology | 2005 | 5 Pages |
Abstract
We investigated surface morphology of LaNiO3 thin films on LaAlO3 (100), SrTiO3(100), MgO(100) and sapphire (0001) substrates by using atomic force microscope (AFM). Chemical solution deposition process was adopted to prepare thin film with a metal naphthenate precursor. The power spectral density of thin films on LaAlO3 and SrTiO3 substrates exhibits an inflated shape at a spatial frequency into 10 μmâ1 range with uniformly formed small grains, while LaNiO3 on sapphire showed a high root mean square roughness.
Related Topics
Physical Sciences and Engineering
Materials Science
Nanotechnology
Authors
Kyu-Seog Hwang, Bo-An Kang, Young-Sun Jeon, Jun-Hyung An, Byung-Hoon Kim, Keishi Nishio, Toshio Tsuchiya,