Article ID Journal Published Year Pages File Type
9812231 Thin Solid Films 2005 4 Pages PDF
Abstract
Quantum well (QW) structures of AlxGa1-xAs/GaAs were characterized by photoluminescence technique as a function of the temperature between 10 and 300 K. The structures were grown on a 500 nm thick GaAs buffer layer with Molecular Beam Epitaxy technique. We have studied the properties of in-situ Cl2-etched GaAs surfaces and overgrown QW structures as a function of the etching temperature (70 and 200 °C). Several models were used to fit the experimental points. Best fit to experimental points was obtained with the Pässler model.
Related Topics
Physical Sciences and Engineering Materials Science Nanotechnology
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