| Article ID | Journal | Published Year | Pages | File Type |
|---|---|---|---|---|
| 9812580 | Thin Solid Films | 2005 | 6 Pages |
Abstract
Reason: The secondary ion mass spectrometry (SIMS) profile published in this paper had already been included in articles published in Mater. Lett., 58 (2004) 3741-3744 and in J. Crystal Growth, 273 (2005) 451-457. In the former, the SIMS data describe a sample prepared under different conditions. The author did not notify either the Thin Solid Films Editors or the coauthors of this fact. The author apologizes sincerely to the readers, referees, and Editors for violating the guidelines of ethical publication. Also the author apologizes to the coauthors for mishandling of the manuscript.
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Authors
Guodong Yuan, Liping Zhu, Zhizhen Ye, Qing Qian, Binghui Zhao, Ruixing Fan,