Article ID | Journal | Published Year | Pages | File Type |
---|---|---|---|---|
9812582 | Thin Solid Films | 2005 | 5 Pages |
Abstract
The dependences of the Seebeck coefficient S on the thickness (d = 5-110 nm) of SnTe thin films grown by thermal evaporation in vacuum on (001)KCl substrates were obtained at room temperature. Distinct oscillations in the S(d)-dependences were observed and attributed to the size quantization effect in SnTe thin films. The monotonic component of the d-dependences of S decreases with increasing thickness. In this connection it is suggested that the equilibrium concentration of non-stoichiometric cation vacancies depends on the SnTe film thickness.
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Physical Sciences and Engineering
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Authors
E.I. Rogacheva, O.N. Nashchekina, Ye.O. Vekhov, M.S. Dresselhaus, G. Dresselhaus,