| Article ID | Journal | Published Year | Pages | File Type |
|---|---|---|---|---|
| 9812639 | Thin Solid Films | 2005 | 7 Pages |
Abstract
A procedure for simultaneous determination of the thickness and the optical dielectric constant of a thin organic film on a transparent substrate has been proposed. With this procedure these physical quantities can be determined from data collected by a conventional ultraviolet-visible spectrometer without depending on any dispersion model of the organic film. The thickness and the dielectric constant (in the wave number range of 3.6Ã104-1.2Ã104 cmâ1) have been determined for 25-layer and 37-layer Langmuir-Blodgett films of a calcium arachidate-arachidic acid mixture. The results for these films agree with each other, showing the utility of the proposed procedure.
Keywords
Related Topics
Physical Sciences and Engineering
Materials Science
Nanotechnology
Authors
Keiichi Ikegami,