Electron field emission from carbon-based materials

We have first attempted to categorise the amorphous carbon films found in the literature and two generic models emerge which can be used to explain the emission process. One is based on space charge-induced band bending for films with low defect densities and the second model for films with high defect densities is based on nanoscale dielectric inhomogeneities. Backed by experimental data, we will show computer simulation results that confirm our findings from a qualitative point of view and propose a model to explain the low threshold electron field emission from a majority of defective diamond-like carbon (DLC) thin films. Integrated structures that can be fabricated with gates suitable for a planar device structure will also be introduced.